New NSLS-II beamline illuminates electronic structures

On July 15, 2018, the Soft Inelastic X-ray Scattering (SIX) beamline at the National Synchrotron Light Source II (NSLS-II)—a U.S. Department of Energy (DOE) Office of Science User Facility at DOE’s Brookhaven National Laboratory—welcomed its first visiting researchers. SIX is an experimental station designed to measure the electronic properties of solid materials using ultrabright x-rays. The materials can be as small as a few microns—one millionth of a meter.