Researchers discover wheat yield-enhancing gene

Researchers led by Dr. Jiao Yuling from the Institute of Genetics and Developmental Biology of the Chinese Academy of Sciences, together with collaborators from Peking University, have found that gene editing of an APETALA2/ethylene responsive factor (AP2/ERF) transcription factor, DUO1, could significantly improve wheat grain yield. Results were published in Nature Plants.


Click here for original story, Researchers discover wheat yield-enhancing gene


Source: Phys.org