In a recent publication in the journal Advanced Materials, a team of physicists and chemists from TU Dresden presents an organic thin-film sensor that describes a completely new way of identifying the wavelength of light and achieves a spectral resolution below one nanometer. As integrated components, the thin-film sensors could eliminate the need for external spectrometers in the future. A patent application has already been filed for the novel technology.
Click here for original story, Organic thin-film sensors for light-source analysis and anti-counterfeiting applications
Source: Phys.org