Expanding on their recently developed electrochemical 3D atomic force microscopy (EC-3D-AFM) technique, University of Illinois Urbana-Champaign researchers have derived the depth profile of the charge density of electric double layers (EDLs). Through statistical analysis, peak deconvolution, and electrostatic calculations, the researchers developed charge profiling 3D AFM (CP-3D-AFM) to experimentally quantify the charge distribution at electrode-electrolyte interfaces.
Click here for original story, Deconvoluting the data: Charge density distributions of electric double layers
Source: Phys.org