Germany’s first cryogenic measuring setup for statistical quality measurement of qubit devices on whole 200- and 300-mm wafers has started operation at Fraunhofer IAF. The on-wafer prober can characterize devices based on semiconductor quantum dots and quantum wells as well as superconductors at measurement temperatures below 2 K.
Click here for original story, Cryogenic on-wafer prober determines quality of qubit devices for quantum computing and quantum sensing
Source: Phys.org