Abstract: Single-Event Effects (SEE) testing was conducted on the nVidia GTX 1050 Graphics Processor Unit (GPU);…
Author: New NASA STI
Proton Testing of nVidia Jetson TX1
Abstract: Single-Event Effects (SEE) testing was conducted on the nVidia Jetson TX1 System on Chip (SOC);…
Heavy Ion Test Report for the AD9257-EP Analog-to-Digital Converter
Abstract: The purpose of this test campaign is to determine the heavy ion-induced single-event effect (SEE)…
Heavy Ion Test Report for the LTC6268-10 Operational Amplifier
Abstract: The purpose of this test is to determine the heavy ion-induced single-event effect (SEE) susceptibility…
Micron MT29F128G08AJAAA 128GB Asynchronous Flash Memory Total Ionizing Dose Characterization Test Report
Abstract: The purpose of this test was to characterize the Micron MT29F128G08AJAAAs parameter degradation for total…
Single-Event Effect Testing of the Vishay Si7414DN n-Type TrenchFET(Registered Trademark) Power MOSFET
Abstract: This study was being undertaken to determine the single event effect susceptibility of the commercial…
New Understanding of Hubble Space Telescope Gyro Current Increase Led to a Method to Save a Failing Gyro
Abstract: Throughout the history of the Hubble Space Telescope (HST) program, gyro current increases have been…
Compendium of Current Total Ionizing Dose and Displacement Damage Results from NASA Goddard Space Flight Center and NASA Electronic Parts and Packaging Program
Abstract: Total ionizing dose and displacement damage testing was performed to characterize and determine the suitability…
New Understanding of Hubble Space Telescope Gyro Current Increase Led to a Method to Save a Failing Gyro Presentation
Abstract: Throughout the history of the Hubble Space Telescope (HST) program, gyro current increases have been…
Kepler Planet Reliability Metrics: Astrophysical Positional Probabilities for Data Release 25
Abstract: This document is very similar to KSCI-19092-003, Planet Reliability Metrics: Astrophysical Positional Probabilities, which describes…