Abstract: Presentation on the impact of high-resolution site characterization during baseline groundwater sampling prior to groundwater…
Author: New NASA STI
Single-Event Threats for Diodes – It’s Not Just Schottky Diodes
Abstract: We present destructive single-event effects characterization of a variety of silicon Schottky diodes from different…
Radiation Hardness Assurance (RHA): Challenges and New Considerations
Abstract: Use of commercial-off-the-shelf (COTS) components and emerging technologies often require space flight missions to accept…
Characterization of System on a Chip (SoC) Single Event Upset (SEU) Responses Using SEU Data, Classical Reliability Models, and Space Environment Data
Abstract: We propose a method for the application of single event upset (SEU) data towards the…
New Developments in Error Detection and Correction Strategies for Critical Applications
Abstract: The presentation will cover a variety of mitigation strategies that were developed for critical applications.…
NASA Past, Present, and Future: The Use of Commercial Off The Shelf (COTS) Electronics in Space
Abstract: NASA has a long history of using commercial grade electronics in space. In this presentation…
Considerations for GPU SEE Testing
Abstract: This presentation will discuss the considerations an engineer should take to perform Single Event Effects…
The Great Proton Search Continues
Abstract: This presentation is an outbrief of the current team status for access to domestic high…
Proton Testing: Opportunities, Pitfalls and Puzzles
Abstract: Although proton SEE testing can place constraints on some heavy-ion SEE susceptibilities, it is important…
Managing Capital Investments and Resources for Large, Complex Satellite Development Efforts
Abstract: Once the schedule was baselined and the primary, secondary, and tertiary critical paths (at least)…