Based on a study of the optical properties of novel ultrathin semiconductors, researchers of Ludwig-Maximilians-Universitaet (LMU) in Munich have developed a method for rapid and efficient characterization of these materials.
Based on a study of the optical properties of novel ultrathin semiconductors, researchers of Ludwig-Maximilians-Universitaet (LMU) in Munich have developed a method for rapid and efficient characterization of these materials.