A new nanomaterials microscopy approach called Pulsed Force Kelvin Probe Force Microscopy (PF-KPFM), allows for less than 10 nanometer measurements of work function and surface potential in a single-pass AFM scan. The findings have been published in two related articles in ACS Nano and Angewandte Chemie International Edition.
Click here for original story, New microscopy under ambient achieves less than 10 nm spatial resolution on surface potential measurement
Source: Phys.org