Wavefront measurement has various applications in high power amplifiers, adaptive optical system, and phase microscopy. Among methods for high-precision wavefront measurement, the coherent diffraction imaging (CDI) is a technique that employs iterative algorithms to reconstruct the phase and amplitude information of the test object from its diffraction intensities. However, it requires multiple exposures of intensity images via mechanical and electrical scanning. Although some researchers have used a random phase mask to modulate the wavefront of the laser beam to simultaneously capture required images, the setup cannot be used for X-rays.
Click here for original story, Multi-focal Fibonacci sieve advances single-shot multi-planar wavefront measurement
Source: Phys.org