PSI scientists have gained a fundamental understanding of a highly promising material that could be suited to future data storage applications. Their experiments with strontium-iridium oxide, Sr2IrO4, investigated both the magnetic and electronic properties of the material as a thin film. They also analyzed how these properties can be systematically controlled by manipulating the films. This study was made possible by sophisticated X-ray scattering, a technology where PSI researchers are amongst the world experts. The results are published today in the journal Proceedings of the National Academy of Sciences.
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Source: Phys.org