Extreme Ultraviolet (EUV) light in microscopy offers the advantage of obtaining a high-resolution image combined with spectral information about the object under study. However, because EUV microscopy uses diffraction instead of lenses, imaging with more than one wavelength is challenging. Researchers at ARCNL and Vrije Universiteit Amsterdam have found a work-around by designing a new class of diffractive optical elements for EUV light. Their results offer possibilities to improve both the light sources and the optical elements in EUV microscopy, paving the way for widespread use of the technique in nanoscience. On January 25th they published their results in the journal Optica.
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Source: Phys.org