First direct band gap measurements of wide-gap hydrogen using inelastic X-ray scattering

Utilizing a newly developed state-of-the-art synchrotron technique, a group of scientists led by Dr. Ho-kwang Mao, Director of HPSTAR, conducted the first-ever high-pressure study of the electronic band and gap information of solid hydrogen up to 90 GPa. Their innovative high pressure inelastic X-ray scattering result serves as a test for direct measurement of the process of hydrogen metallization and opens a possibility to resolve the electronic dispersions of dense hydrogen. This work is published in a recent issue of Physical Review Letters.


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Source: Phys.org