Transient grating spectroscopy with ultrafast X-rays

Researchers at the Paul Scherrer Institute PSI have succeeded for the first time in looking inside materials using the method of transient grating spectroscopy with ultrafast X-rays at SwissFEL. The experiment at PSI is a milestone in observing processes in the world of atoms. The researchers are publishing their research results today in the journal Nature Photonics.


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Source: Phys.org