Levitated nanoparticles are promising tools for sensing ultra-weak forces of biological, chemical or mechanical origin and even for testing the foundations of quantum physics. However, such applications require precise position measurement. Researchers at the Department of Experimental Physics of the University of Innsbruck, Austria, have now demonstrated a new technique that boosts the efficiency with which the position of a sub-micron levitated object is detected.
Click here for original story, Position measurement of a levitated nanoparticle via interference with its mirror image
Source: Phys.org