Accelerating development of STT-MRAM

Researchers at the Center for Innovative Integrated Electronic Systems (CIES) at Tohoku University have successfully observed microscopic chemical bonding states in ultrathin MgO—an important determinant in STT-MRAM performance. The observation was carried out via an angle-resolved hard X-ray photoelectron spectroscopy (AR-HAXPES) in collaboration with Japan Synchrotron Radiation Research Institute (JASRI) at its Spring-8 Synchrotron Radiation facility.


Click here for original story, Accelerating development of STT-MRAM


Source: Phys.org